Thermogradient mechanism of p-n junction formation by laser radiation in semiconductors
Identifieur interne : 00E796 ( Main/Repository ); précédent : 00E795; suivant : 00E797Thermogradient mechanism of p-n junction formation by laser radiation in semiconductors
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Abstract
We show that creation of a p-n junction in p-Si and p-InSb involve so-called donor laser centres (LCs). Analysis of our experimental data and other authors on p-n junction formation in p-InSb and p-Si using of laser radiation (LR) allowed us to conclude that a thermogradient effect plays the main role in this process. The following methods have been used in experiments: four-probe method and magnetoconcentration effect (MCE) (I-V characteristics in an external perpendicular magnetic field). A temperature gradient was created by YAG:Nd laser in the Q-modulation regime. Experiments on p-Si have shown that the LCs are n-type and they are created in materials doped with B and O only. Three types of LC were found: one type is stable at room temperature and two types are unstable. The effect of LC accumulation and saturation takes place in Si. The calculated distribution of O atoms in temperature gradient field and experiment are in qualitative agreement. Experiments on p-InSb have been carried out at 200 and 290 K. Generation of stable and unstable LC at room temperature was shown. Threshold intensities of LC generation are 1.5 MW/cm2at 200 C and 2 MW/cm2 at 290 C. We conclude that generation of LC occurs in solid state.
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Thermogradient mechanism of p-n junction formation by laser radiation in semiconductors</title>
<author><name sortKey="Medvid, Artur" uniqKey="Medvid A">Artur Medvid</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Riga Technical University, 14 Azenes Street</s1>
<s2>1048 Riga</s2>
<s3>LVA</s3>
<sZ>1 aut.</sZ>
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<country>Lettonie</country>
<wicri:noRegion>1048 Riga</wicri:noRegion>
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<author><name sortKey="Fedorenko, Leonid" uniqKey="Fedorenko L">Leonid Fedorenko</name>
<affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Institute of Semiconductor Physics, 45 Prospect Nauki</s1>
<s2>Kyiv</s2>
<s3>UKR</s3>
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<term>Formation mechanism</term>
<term>IV characteristic</term>
<term>Indium antimonides</term>
<term>Laser beams</term>
<term>Semiconductor materials</term>
<term>Silicon</term>
<term>Temperature gradients</term>
<term>p n junctions</term>
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<keywords scheme="Pascal" xml:lang="fr"><term>Jonction p n</term>
<term>Mécanisme formation</term>
<term>Semiconducteur</term>
<term>Faisceau laser</term>
<term>Caractéristique courant tension</term>
<term>Gradient température</term>
<term>Silicium</term>
<term>Indium antimoniure</term>
<term>Si</term>
<term>In Sb</term>
<term>InSb</term>
<term>7340K</term>
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<front><div type="abstract" xml:lang="en">We show that creation of a p-n junction in p-Si and p-InSb involve so-called donor laser centres (LCs). Analysis of our experimental data and other authors on p-n junction formation in p-InSb and p-Si using of laser radiation (LR) allowed us to conclude that a thermogradient effect plays the main role in this process. The following methods have been used in experiments: four-probe method and magnetoconcentration effect (MCE) (I-V characteristics in an external perpendicular magnetic field). A temperature gradient was created by YAG:Nd laser in the Q-modulation regime. Experiments on p-Si have shown that the LCs are n-type and they are created in materials doped with B and O only. Three types of LC were found: one type is stable at room temperature and two types are unstable. The effect of LC accumulation and saturation takes place in Si. The calculated distribution of O atoms in temperature gradient field and experiment are in qualitative agreement. Experiments on p-InSb have been carried out at 200 and 290 K. Generation of stable and unstable LC at room temperature was shown. Threshold intensities of LC generation are 1.5 MW/cm<sup>2</sup>
at 200 C and 2 MW/cm<sup>2</sup>
at 290 C. We conclude that generation of LC occurs in solid state.</div>
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<fA14 i1="01"><s1>Riga Technical University, 14 Azenes Street</s1>
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<fA14 i1="02"><s1>Institute of Semiconductor Physics, 45 Prospect Nauki</s1>
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<fA15 i1="01"><s1>Institute of Applied Physics, University of Tsukuba</s1>
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<fA15 i1="02"><s1>Photoreaction Control Research Center, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 5, 1-1-1 Higashi</s1>
<s2>Tsukuba, Ibaraki 305-8565</s2>
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<fA15 i1="03"><s1>Institute of Electronic Structure and Laser, Foundation for Research and Technology, Hellas, P.O. Box 1527</s1>
<s2>Heraklion 71110</s2>
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<sZ>4 aut.</sZ>
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<fA15 i1="04"><s1>Physics Department, Washington State University, Webster 248</s1>
<s2>Pullman, WA 99164-2814</s2>
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<fA15 i1="05"><s1>Naval Research Laboratory</s1>
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<fC01 i1="01" l="ENG"><s0>We show that creation of a p-n junction in p-Si and p-InSb involve so-called donor laser centres (LCs). Analysis of our experimental data and other authors on p-n junction formation in p-InSb and p-Si using of laser radiation (LR) allowed us to conclude that a thermogradient effect plays the main role in this process. The following methods have been used in experiments: four-probe method and magnetoconcentration effect (MCE) (I-V characteristics in an external perpendicular magnetic field). A temperature gradient was created by YAG:Nd laser in the Q-modulation regime. Experiments on p-Si have shown that the LCs are n-type and they are created in materials doped with B and O only. Three types of LC were found: one type is stable at room temperature and two types are unstable. The effect of LC accumulation and saturation takes place in Si. The calculated distribution of O atoms in temperature gradient field and experiment are in qualitative agreement. Experiments on p-InSb have been carried out at 200 and 290 K. Generation of stable and unstable LC at room temperature was shown. Threshold intensities of LC generation are 1.5 MW/cm<sup>2</sup>
at 200 C and 2 MW/cm<sup>2</sup>
at 290 C. We conclude that generation of LC occurs in solid state.</s0>
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